Shaft alignment for rotary machines using wireless power transfer process: Foundations and design approach.

Authors: Aomar, Lyes^1,2 (AUTHOR) aomarlyes@univ-jijel.dz, Ikhelef, Nabil^1,2 (AUTHOR), Taibi, Ahmed² (AUTHOR)

Source: International Journal of Applied Electromagnetics & Mechanics. 2024, Vol. 76 Issue 1/2, p161-169. 9p.

Subject Terms: *MEAN time between failure, *WIRELESS power transmission, *SHAFTING machinery, *MUTUAL inductance, *ROTATING machinery

A Self-Healing and Fault-Tolerant Cloud-Based Digital Twin Processing Management Model

Authors: Saxena, D., Singh, A.K.

Source: IEEE Transactions on Industrial Informatics IEEE Trans. Ind. Inf. Industrial Informatics, IEEE Transactions on. 21(5):4233-4242 May, 2025

Time-Sensitive Networking (TSN) for Industrial Automation: Current Advances and Future Directions.

Authors: Zhang, Tianyu¹ (AUTHOR) tianyu-zhang@uiowa.edu, Wang, Gang² (AUTHOR) gang.wang2@emerson.com, Xue, Chuanyu³ (AUTHOR) chuanyu.xue@uconn.edu, Wang, Jiachen³ (AUTHOR) jc.wang@uconn.edu, Nixon, Mark² (AUTHOR) mark.nixon@emerson.com, Han, Song³ (AUTHOR) song.han@uconn.edu

Source: ACM Computing Surveys. Feb2025, Vol. 57 Issue 2, p1-38. 38p.

Subject Terms: *MEAN time between failure, *INDUSTRIAL robots, *INFORMATION technology, *ETHERNET, INTEGRATED circuit design, ELECTRIC power equipment, LINEAR network coding

Dependability analysis of paper mill plant under multi-state repairable systems execution.

Authors: Shivanit¹, Ram, Mangey², Goyal, Nupur¹ nupurgoyalgeu@gmail.com, Kumar, Akshay³

Source: Nonlinear Studies. 2024, Vol. 31 Issue 2, p557-577. 21p.

Subject Terms: *MEAN time between failure, *PAPER mills, *SYSTEM failures, *MARKOV processes, *SYSTEM analysis

Preface to the Special Issue on Probability and Stochastic Processes with Applications to Communications, Systems and Networks, 2nd Edition.

Authors: Bochkov, Alexander¹ (AUTHOR), Tsitsiashvili, Gurami² (AUTHOR)

Source: Mathematics (2227-7390). Mar2025, Vol. 13 Issue 6, p922. 5p.

Subject Terms: *PARTICLE swarm optimization, *MEAN time between failure, *PROBABILITY density function, *OPTIMIZATION algorithms, *LINEAR programming, *QUEUING theory, *ADAPTIVE fuzzy control, *MARKOV processes

Grey Duane model for reliability growth prediction under small sample uncertain failure data.

Authors: Liu, Lianyi¹ (AUTHOR), Liu, Sifeng¹ (AUTHOR), Dong, Wenjie¹ (AUTHOR) dongwenjie@nuaa.edu.cn

Source: Quality Engineering. 2024, Vol. 36 Issue 4, p790-804. 15p.

Subject Terms: *MEAN time between failure, *SYSTEMS theory, *RELIABILITY in engineering, ENGINEERING reliability theory, ELECTRONIC equipment

DevOps Metrics and KPIs: A Multivocal Literature Review.

Authors: Amaro, Ricardo¹ (AUTHOR) ricardo_amaro@iscte-iul.pt, Pereira, Rúben² (AUTHOR) ruben.filipe.pereira@iscte-iul.pt, Mira da Silva, Miguel³ (AUTHOR) mms@tecnico.ulisboa.pt

Source: ACM Computing Surveys. Sep2024, Vol. 56 Issue 9, p1-41. 41p.

Subject Terms: *MANAGEMENT information systems, *MEAN time between failure, *CORPORATE culture, *MANUFACTURING processes, SCIENTIFIC literature, SOFTWARE measurement, AGILE software development

Deepening Mines Demand Advanced Pumps: Suppliers announce solutions with automation options and that move more water further.

Authors: Morton, Jesse

Source: Engineering & Mining Journal (00958948). Nov2024, Vol. 225 Issue 11, p42-45. 5p.

Subject Terms: *MEAN time between failure, *MINING engineering, *SLURRY

The intersection of supply chain and aircraft availability.

Authors: Delaney, Robert J. (AUTHOR) Robert.Delaney.4@us.af.mil, Femano, Amanda L. (AUTHOR) amanda.femano@us.af.mil

Source: Supply Chain Management Review. Mar/Apr2025, Vol. 29 Issue 2, p18-25. 8p. 1 Color Photograph, 7 Diagrams, 4 Charts.

Subject Terms: *MEAN time between failure, *SUPPLY chain management, *DECISION making in investments, MILITARY supplies, NATIONAL security

Calculation of the high-energy neutron flux for anticipating errors and recovery techniques in exascale supercomputer centres.

Authors: Asorey, Hernán^1,2 (NURSE) hernanasorey@cnea.gob.ar, Mayo-García, Rafael³ (AUTHOR)

Source: Journal of Supercomputing. May2023, Vol. 79 Issue 8, p8205-8235. 31p.

Subject Terms: *NEUTRON flux, *MEAN time between failure, *SINGLE event effects, *ATMOSPHERIC radiation, *NEUTRON temperature

Small Countries, Big Challenges.

Source: Military Technology. 2023 Special Issue, Vol. 47, p25-28. 4p.

Subject Terms: *SMALL states, *MEAN time between failure

TECHNOLOGY SURVEY: A Sampling of Power Amplifiers for Electromagnetic Attack Applications.

Authors: Knowles, John, Holt, Ollie

Source: Journal of Electromagnetic Dominance. Jun2024, Vol. 47 Issue 6, p29-36. 8p.

Subject Terms: *POWER amplifiers, *MEAN time between failure, *RADAR interference

A predictive and explanatory model for remaining useful life of crushers using deep learning.

Authors: Kristjanpoller, Fredy¹ (AUTHOR), Vásquez, Raymi¹ (AUTHOR), Kristjanpoller, Werner¹ (AUTHOR) werner.kristjanpoller@usm.cl, Minutolo, Marcel C.² (AUTHOR), Jackson, Canek³ (AUTHOR)

Source: Neural Computing & Applications. Nov2024, Vol. 36 Issue 32, p20575-20588. 14p.

Subject Terms: *REMAINING useful life, *MEAN time between failure, *CONVOLUTIONAL neural networks, *ARTIFICIAL intelligence, *FAILURE analysis, *DEEP learning

Bayesian estimation of the mean time between failures of subsystems with different causes using interval‐censored system maintenance data.

Authors: Han, David¹ (AUTHOR) david.han@utsa.edu, Brownlow, James D.² (AUTHOR), Thompson, Jesse² (AUTHOR), Brooks, Ralph G.² (AUTHOR)

Source: Quality & Reliability Engineering International. Nov2024, Vol. 40 Issue 7, p3867-3887. 21p.

Subject Terms: *MEAN time between failure, *POISSON processes, *RELIABILITY in engineering, *DISTRIBUTION (Probability theory), *COMPETING risks

Methodology of Shipboard Spare Parts Requirements Based on Whole Part Repair Strategy.

Authors: Wang, Houxiang¹ (AUTHOR) m22170101@nue.edu.cn, Liu, Haitao¹ (AUTHOR) m22170102@nue.edu.cn, Shao, Songshi² (AUTHOR) m22180801@nue.edu.cn, Zhang, Zhihua² (AUTHOR) 228002010071@stu.nepu.edu.cn

Source: Mathematics (2227-7390). Oct2024, Vol. 12 Issue 19, p3053. 25p.

Subject Terms: *MEAN time between failure, *SPARE parts, *NAVAL logistics, *INVENTORY control, *SHIP maintenance

Maintenance software features keep expanding.

Authors: LORENZI, NEAL

Source: Health Facilities Management. Jan/Feb2025, Vol. 38 Issue 1, p68-71. 4p.

Subject Terms: *MEAN time between failure, *HEALTH facilities, *ORDER management systems, *COMPUTERIZED maintenance management systems, *FACILITY management

Highly accelerated life testing (HALT): A review from a statistical perspective.

Authors: Collins, David H.¹ (AUTHOR), Huzurbazar, Aparna V.² (AUTHOR), Warr, Richard L.³ (AUTHOR) warr@stat.byu.edu

Source: WIREs: Computational Statistics. Jul/Aug2024, Vol. 16 Issue 4, p1-25. 25p.

Subject Terms: *MEAN time between failure, *ACCELERATED life testing, *FAILURE mode & effects analysis, *METAL fatigue, *STATISTICAL reliability

The Impact of Temperature on the Performance and Reliability of Li/SOCl 2 Batteries.

Authors: Sun, Yongquan¹ (AUTHOR) 2320610165@stu.hrbust.edu.cn, Qin, Xinkun¹ (AUTHOR) qjia89@hrbust.edu.cn, Li, Lin¹ (AUTHOR), Zhang, Youmei¹ (AUTHOR), Zhang, Jiahai² (AUTHOR), Qi, Jia¹ (AUTHOR)

Source: Energies (19961073). Jul2024, Vol. 17 Issue 13, p3063. 14p.

Subject Terms: *MEAN time between failure, *HYSTERESIS, *NEGATIVE electrode, *WEIBULL distribution

Reliability Prediction for Computer Numerical Control Machine Servo Systems Based on an IPSO-Based RBF Neural Network.

Authors: Jiang, Zheng¹ (AUTHOR), Wang, GuangJian¹ (AUTHOR), Huang, ZuGuang² (AUTHOR), He, Ye¹ (AUTHOR), Xue, RuiJuan² (AUTHOR)

Source: Shock & Vibration. 4/21/2022, p1-12. 12p.

Subject Terms: *AUTOMATION, *MEAN time between failure, *PARTICLE swarm optimization, *RADIAL basis functions, *SERVOMECHANISMS, *BACK propagation, *RELIABILITY in engineering

A Weibull–lognormal-based life prediction model for LED light with four groups of ADTs.

Authors: Zhang, J, Mu, R, Fu, J, Zhang, Y, Li, J

Source: Lighting Research & Technology; May2025, Vol. 57 Issue 3, p292-301, 10p

Subject Terms: LIGHT emitting diodes, WEIBULL distribution, ACCELERATED life testing, FAILURE analysis, LIGHT intensity, DURABILITY, MEAN time between failure, LOGNORMAL distribution