Autori:
Xia, B., Zhang, Y., Wang, S., Wang, Y., Wu, X., Tian, Y., Yang, W., Timotfe, R., Van Gool, L.
Fonte:
IEEE Transactions on Pattern Analysis and Machine Intelligence IEEE Trans. Pattern Anal. Mach. Intell. Pattern Analysis and Machine Intelligence, IEEE Transactions on. 47(3):1578-1593 Mar, 2025
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